Analysis of the x-ray refraction using an array-structured detector

A crystal-less method for analyzing the phase shifts of an x-ray beam passed through a sample is here presented. An array-structured detector is used both to record and analyze the refracted and scattered radiation. Experimental studies of simple phase objects confirmed that images show features similar or equivalent to the ones produced using an analyzer crystal with comparable signal-to-noise ratio values. Using a detector for analyzing the refraction presents evident advantages in terms of optical stability. In addition, with a single acquisition, several refraction angles can be simultaneously analyzed permitting a better exploitation of the dose delivered to the sample.