The dosimetry of X-ray microbeams using MOSFETs results in an asymmetrical beam profile due to a lack of lateral charged particle equilibrium. Monte Carlo simulations were carried out using PENELOPE and GEANT4 codes to study this effect and a MOSFET on a micropositioner was scanned in the microbeam. Based on the simulations a new method of microbeam dosimetry is proposed. The proposed edge-on face-to-face (EOFF) MOSFET detector, a die arrangement proposed here for the first time, should alleviate the asymmetry. Further improvement is possible by thinning the silicon body of the MOSFET.
Rosenfeld, A., Siegbahn, E., Brauer-Krish, E., Holmes-Siedle, A., Lerch, M., Bravin, A., et al. (2005). Edge-on Face-to-Face MOSFET for synchrotron microbeam dosimetry: MC modeling. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 52(6), 2562-2569 [10.1109/TNS.2005.860704].
Edge-on Face-to-Face MOSFET for synchrotron microbeam dosimetry: MC modeling
Bravin AMembro del Collaboration Group
;
2005
Abstract
The dosimetry of X-ray microbeams using MOSFETs results in an asymmetrical beam profile due to a lack of lateral charged particle equilibrium. Monte Carlo simulations were carried out using PENELOPE and GEANT4 codes to study this effect and a MOSFET on a micropositioner was scanned in the microbeam. Based on the simulations a new method of microbeam dosimetry is proposed. The proposed edge-on face-to-face (EOFF) MOSFET detector, a die arrangement proposed here for the first time, should alleviate the asymmetry. Further improvement is possible by thinning the silicon body of the MOSFET.
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