We present developments in the technique of photo-induced near-field electron microscopy. (PINEM) We image the electron interaction with a far-field plane wave reflected from a mirror, and with the near-field resonance of a plasmonic nanowire.

Wang, K., Vanacore, G., Pomarico, E., Madan, I., Berruto, G., de Abajo, F., et al. (2018). Photon-induced far-field and near-field electron microscopy. In Optics InfoBase Conference Papers. OSA - The Optical Society [10.1364/CLEO_SI.2018.STh1N.4].

Photon-induced far-field and near-field electron microscopy

Vanacore G. M.;
2018

Abstract

We present developments in the technique of photo-induced near-field electron microscopy. (PINEM) We image the electron interaction with a far-field plane wave reflected from a mirror, and with the near-field resonance of a plasmonic nanowire.
paper
Ultrafast Electron Microscopy; PINEM; electron-light interaction;
English
CLEO: Science and Innovations, CLEO_SI 2018 13-18 May
2018
Optics InfoBase Conference Papers
978-155752820-9
2018
2018
none
Wang, K., Vanacore, G., Pomarico, E., Madan, I., Berruto, G., de Abajo, F., et al. (2018). Photon-induced far-field and near-field electron microscopy. In Optics InfoBase Conference Papers. OSA - The Optical Society [10.1364/CLEO_SI.2018.STh1N.4].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/302326
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