Micro patterns can be a useful proxy for the quality of software. Classes matching certain categories of micro patterns were shown to be more fault prone than others, and those classes that do not correspond to any category of micro patterns were shown to be more likely to be faulty. In this paper we present a preliminary study of traditional software metrics and micro patterns in three versions of Eclipse (2.1, 3.0, 3.1) in order to understand if it is possible to relate the stability of a software system with micro patterns.

Ortu, M., Destefanis, G., Orru', M., Tonelli, R., Marchesi, M. (2015). Could micro patterns be used as software stability indicator?. In 2015 IEEE 2nd International Workshop on Patterns Promotion and Anti-Patterns Prevention, PPAP 2015 - Proceedings (pp.11-12). Institute of Electrical and Electronics Engineers Inc. [10.1109/PPAP.2015.7076850].

Could micro patterns be used as software stability indicator?

Orru', M;
2015

Abstract

Micro patterns can be a useful proxy for the quality of software. Classes matching certain categories of micro patterns were shown to be more fault prone than others, and those classes that do not correspond to any category of micro patterns were shown to be more likely to be faulty. In this paper we present a preliminary study of traditional software metrics and micro patterns in three versions of Eclipse (2.1, 3.0, 3.1) in order to understand if it is possible to relate the stability of a software system with micro patterns.
paper
Fault-prone; Micro pattern; Quality of softwares;
English
2nd IEEE International Workshop on Patterns Promotion and Anti-Patterns Prevention, PPAP 2015 2 March
2015
2015 IEEE 2nd International Workshop on Patterns Promotion and Anti-Patterns Prevention, PPAP 2015 - Proceedings
978-146736920-6
2015
11
12
7076850
none
Ortu, M., Destefanis, G., Orru', M., Tonelli, R., Marchesi, M. (2015). Could micro patterns be used as software stability indicator?. In 2015 IEEE 2nd International Workshop on Patterns Promotion and Anti-Patterns Prevention, PPAP 2015 - Proceedings (pp.11-12). Institute of Electrical and Electronics Engineers Inc. [10.1109/PPAP.2015.7076850].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/302121
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