About 20 mum thick Ce-doped Lu 3Al 5O 12 thin films grown by Liquid Phase Epitaxy and thin plates of similar thickness prepared by mechanical cutting and polishing from Czochralski grown crystals are used in 2D-imaging experiment down to mum 2D-resolution. Their scintillation response is also measured under alpha-particle excitation and performance of film and bulk material is mutually compared. Furthermore, scintillation and thermoluminescence characteristics of UV emitting Sc-doped LuAG grown by Czochralski method are presented since this system is a candidate material for UV emission-based 2D sensors with improved diffraction limit with respect to the presently used Ce-doped aluminum garnets

Nikl, M., Tous, J., Mares, J., Prusa, P., Mihokova, E., Blazek, K., et al. (2009). Lu3Al5O12-based materials for high 2D-resolution scintillation detectors. In Non-Intrusive Inspection Technologies II. S P I E - International Society for Optical Engineering [10.1117/12.818358].

Lu3Al5O12-based materials for high 2D-resolution scintillation detectors

VEDDA, ANNA GRAZIELLA;
2009

Abstract

About 20 mum thick Ce-doped Lu 3Al 5O 12 thin films grown by Liquid Phase Epitaxy and thin plates of similar thickness prepared by mechanical cutting and polishing from Czochralski grown crystals are used in 2D-imaging experiment down to mum 2D-resolution. Their scintillation response is also measured under alpha-particle excitation and performance of film and bulk material is mutually compared. Furthermore, scintillation and thermoluminescence characteristics of UV emitting Sc-doped LuAG grown by Czochralski method are presented since this system is a candidate material for UV emission-based 2D sensors with improved diffraction limit with respect to the presently used Ce-doped aluminum garnets
Capitolo o saggio
scintillators; luminescence; radiology
English
Non-Intrusive Inspection Technologies II
2009
978-081947576-3
7310
S P I E - International Society for Optical Engineering
731008
Nikl, M., Tous, J., Mares, J., Prusa, P., Mihokova, E., Blazek, K., et al. (2009). Lu3Al5O12-based materials for high 2D-resolution scintillation detectors. In Non-Intrusive Inspection Technologies II. S P I E - International Society for Optical Engineering [10.1117/12.818358].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/27183
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