It is well known that the later software errors are discovered during the development process, the more costly they are to repair, yet testing and automated analysis tools tend to be applied late in the development cycle. In this paper, we describe a future integrated testing environment (FITE) that continually analyzes code for a variety of functional and non-functional properties to provide developer feedback as code is being written. This instant feedback allows developers to fix errors as they are introduced, increasing developer productivity and software quality. Copyright 2010 ACM.

Whalen, M., Godefroid, P., Polini, A., Tillmann, N., Visser, W., Mariani, L. (2010). FITE: Future Integrated Testing Environment. In Proceedings of the Workshop on the Future of Software Engineering Research (pp.401-405) [10.1145/1882362.1882444].

FITE: Future Integrated Testing Environment

MARIANI, LEONARDO
2010

Abstract

It is well known that the later software errors are discovered during the development process, the more costly they are to repair, yet testing and automated analysis tools tend to be applied late in the development cycle. In this paper, we describe a future integrated testing environment (FITE) that continually analyzes code for a variety of functional and non-functional properties to provide developer feedback as code is being written. This instant feedback allows developers to fix errors as they are introduced, increasing developer productivity and software quality. Copyright 2010 ACM.
paper
Testing, IDE
English
Workshop on the Future of Software Engineering Research
2010
Proceedings of the Workshop on the Future of Software Engineering Research
978-1-4503-0427-6
2010
401
405
none
Whalen, M., Godefroid, P., Polini, A., Tillmann, N., Visser, W., Mariani, L. (2010). FITE: Future Integrated Testing Environment. In Proceedings of the Workshop on the Future of Software Engineering Research (pp.401-405) [10.1145/1882362.1882444].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/22599
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