This paper compares two CMOS technologies, the robust 350nm version and its modern 28nm successor, in terms of time-domain signal processing parameters. The evaluated parameters; propagation delay, delay variation due to process and mismatch fluctuations, sensitivity to noise and area and power usage are crucial especially in measurement devices relying on precise timings, high precision time-to-digital converters, for example. Post-layout simulations show that the modern scaled technology offers superior speed, efficient area usage and low power consumption but suffers from considerable delay mismatch. Therefore applications relying on precise time domain signal processing do not always benefit from technology scaling.

Jansson, J., Keränen, P., Kostamovaara, J., Baschirotto, A. (2017). CMOS technology scaling advantages in time domain signal processing. In I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings (pp.71-75). Institute of Electrical and Electronics Engineers Inc. [10.1109/I2MTC.2017.7969659].

CMOS technology scaling advantages in time domain signal processing

Baschirotto, Andrea
2017

Abstract

This paper compares two CMOS technologies, the robust 350nm version and its modern 28nm successor, in terms of time-domain signal processing parameters. The evaluated parameters; propagation delay, delay variation due to process and mismatch fluctuations, sensitivity to noise and area and power usage are crucial especially in measurement devices relying on precise timings, high precision time-to-digital converters, for example. Post-layout simulations show that the modern scaled technology offers superior speed, efficient area usage and low power consumption but suffers from considerable delay mismatch. Therefore applications relying on precise time domain signal processing do not always benefit from technology scaling.
paper
CMOS; Delay element; Ring oscillator; TDC; Technology scaling; Time-domain; Time-to-digital converter; Instrumentation; Signal Processing; Biomedical Engineering;
English
2017 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017 MAY 22-27
2017
Jansson, Jussi-Pekka
I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings
978-1-5090-3596-0
2017
71
75
7969659
none
Jansson, J., Keränen, P., Kostamovaara, J., Baschirotto, A. (2017). CMOS technology scaling advantages in time domain signal processing. In I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings (pp.71-75). Institute of Electrical and Electronics Engineers Inc. [10.1109/I2MTC.2017.7969659].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/191748
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