The CLARO is a radiation-hard 8-channel ASIC designed for single photon counting with multi-anode photomultiplier tubes. Each channel outputs a digital pulse when the input signal from the photomultiplier crosses a configurable threshold. The fast return to baseline, typically within 25 ns, and below 50 ns in all conditions, allows to count up to 107 hits/s on each channel, with a power consumption of about 1 mW per channel. The ASIC presented here is a much improved version of the first 4-channel prototype. The threshold can be precisely set in a wide range, between 30 ke- (5 fC) and 16 Me- (2.6 pC). The noise of the amplifier with a 10 pF input capacitance is 3.5 ke- (0.6 fC) RMS. All settings are stored in a 128-bit configuration and status register, protected against soft errors with triple modular redundancy. The paper describes the design of the ASIC at transistor-level, and demonstrates its performance on the test bench.
Baszczyk, M., Carniti, P., Cassina, L., Ramusino, A., Dorosz, P., Fiorini, M., et al. (2017). CLARO: An ASIC for high rate single photon counting with multi-anode photomultipliers. JOURNAL OF INSTRUMENTATION, 12(8) [10.1088/1748-0221/12/08/P08019].
CLARO: An ASIC for high rate single photon counting with multi-anode photomultipliers
Carniti, P.;Cassina, L.;Gotti, C.
;Pessina, G.
2017
Abstract
The CLARO is a radiation-hard 8-channel ASIC designed for single photon counting with multi-anode photomultiplier tubes. Each channel outputs a digital pulse when the input signal from the photomultiplier crosses a configurable threshold. The fast return to baseline, typically within 25 ns, and below 50 ns in all conditions, allows to count up to 107 hits/s on each channel, with a power consumption of about 1 mW per channel. The ASIC presented here is a much improved version of the first 4-channel prototype. The threshold can be precisely set in a wide range, between 30 ke- (5 fC) and 16 Me- (2.6 pC). The noise of the amplifier with a 10 pF input capacitance is 3.5 ke- (0.6 fC) RMS. All settings are stored in a 128-bit configuration and status register, protected against soft errors with triple modular redundancy. The paper describes the design of the ASIC at transistor-level, and demonstrates its performance on the test bench.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.