Silica thin films with embedded SnO2 nanoparticles have been grown on transparent substrates by the sol–gel method. Tin dioxide crystals with cassiterite structure are semiconductors with a wide band gap of ~3.6 eV. Optical absorption spectroscopy in the near ultraviolet–visible range has been exploited to probe nanostructuring features of such nanocrystals. The results show that the sintering conditions modify crystallite mean size and enable the occurrence of quantum confinement effects. The outcome is in accordance with transmission electron microscopy data conducted on analogous bulk samples.
Lorenzi, R., Lauria, A., Mochenova, N., Chiodini, N., Paleari, A. (2011). Study of the absorption edge of SnO2 nanoparticles embedded in silica films. JOURNAL OF NON-CRYSTALLINE SOLIDS, 357(8-9), 1888-1891 [10.1016/j.jnoncrysol.2010.12.045].
Study of the absorption edge of SnO2 nanoparticles embedded in silica films
LORENZI, ROBERTO;LAURIA, ALESSANDRO;CHIODINI, NORBERTO;PALEARI, ALBERTO MARIA FELICE
2011
Abstract
Silica thin films with embedded SnO2 nanoparticles have been grown on transparent substrates by the sol–gel method. Tin dioxide crystals with cassiterite structure are semiconductors with a wide band gap of ~3.6 eV. Optical absorption spectroscopy in the near ultraviolet–visible range has been exploited to probe nanostructuring features of such nanocrystals. The results show that the sintering conditions modify crystallite mean size and enable the occurrence of quantum confinement effects. The outcome is in accordance with transmission electron microscopy data conducted on analogous bulk samples.
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