We present a detailed characterization of the growth dynamics of Ga(Al)As(111)A surfaces. We develop a theoretical growth model that well describes the observed behavior on the growth parameters and underlines the Ehrlich-Schwöbel barrier as a leading factor that determines the growth dynamics. On such basis we analyze the factors that lead to the huge observed roughness on such surface orientations and we identify the growth conditions that drive the typical three-dimensional growth of Ga(Al)As(111)A towards an atomically flat surface. GaAs/Al0.30Ga0.70As quantum wells realized on an optimized surface (<0.2 nm roughness) show a record low emission linewidth of 4.5 meV.

Esposito, L., Bietti, S., Fedorov, A., Nötzel, R., Sanguinetti, S. (2017). Ehrlich-Schwöbel effect on the growth dynamics of GaAs(111)A surfaces. PHYSICAL REVIEW MATERIALS, 1(2) [10.1103/PhysRevMaterials.1.024602].

Ehrlich-Schwöbel effect on the growth dynamics of GaAs(111)A surfaces

Esposito, L;Bietti, S;Sanguinetti, S.
2017

Abstract

We present a detailed characterization of the growth dynamics of Ga(Al)As(111)A surfaces. We develop a theoretical growth model that well describes the observed behavior on the growth parameters and underlines the Ehrlich-Schwöbel barrier as a leading factor that determines the growth dynamics. On such basis we analyze the factors that lead to the huge observed roughness on such surface orientations and we identify the growth conditions that drive the typical three-dimensional growth of Ga(Al)As(111)A towards an atomically flat surface. GaAs/Al0.30Ga0.70As quantum wells realized on an optimized surface (<0.2 nm roughness) show a record low emission linewidth of 4.5 meV.
Articolo in rivista - Articolo scientifico
MBE, Quantum wells, Semiconductor compounds, Thin films, Atomic force microscopy, Epitaxy
English
2017
1
2
024602
none
Esposito, L., Bietti, S., Fedorov, A., Nötzel, R., Sanguinetti, S. (2017). Ehrlich-Schwöbel effect on the growth dynamics of GaAs(111)A surfaces. PHYSICAL REVIEW MATERIALS, 1(2) [10.1103/PhysRevMaterials.1.024602].
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/179508
Citazioni
  • Scopus 28
  • ???jsp.display-item.citation.isi??? 31
Social impact