The proceedings contain 6 papers. The topics discussed include: using source code metrics to predict change-prone web services: a case-study on eBay services; investigating code smell co-occurrences using association rule learning: a replicated study; using machine learning to design a flexible LOC counter; machine learning for finding bugs: an initial report; automatic feature selection by regularization to improve bug prediction accuracy; and hyperparameter optimization to improve bug prediction accuracy.

ARCELLI FONTANA, F., Walter, B., Zanoni, M. (2017). IEEE International Workshop on Machine Learning Techniques for Software Quality Evaluation. In IEEE International Workshop on Machine Learning Techniques for Software Quality Evaluation. Institute of Electrical and Electronics Engineers Inc..

IEEE International Workshop on Machine Learning Techniques for Software Quality Evaluation

ARCELLI FONTANA, FRANCESCA;ZANONI, MARCO
2017

Abstract

The proceedings contain 6 papers. The topics discussed include: using source code metrics to predict change-prone web services: a case-study on eBay services; investigating code smell co-occurrences using association rule learning: a replicated study; using machine learning to design a flexible LOC counter; machine learning for finding bugs: an initial report; automatic feature selection by regularization to improve bug prediction accuracy; and hyperparameter optimization to improve bug prediction accuracy.
Si
abstract
Machine Learning Techniques, Software Quality Evaluation
English
Saner 2017 - 24th IEEE International Conference on Software Analysis, Evolution and Reengineering
9781509065974
http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7879540 http://dblp.uni-trier.de/rec/bib/conf/wcre/2017maltesque
ARCELLI FONTANA, F., Walter, B., Zanoni, M. (2017). IEEE International Workshop on Machine Learning Techniques for Software Quality Evaluation. In IEEE International Workshop on Machine Learning Techniques for Software Quality Evaluation. Institute of Electrical and Electronics Engineers Inc..
ARCELLI FONTANA, F; Walter, B; Zanoni, M
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/155466
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