This work lies within SCALTECH28 project, whose main purpose is to investigate the performance of the 28nm technology in terms of signal processing quality, power consumption, and radiation hardness for applications in instrumentation electronics for particle physics with respect to previous technological generations. An additional target is to experimentally evaluate radiation damage effects on single devices and on full circuits to develop rad-models for simulations. A test chip including elementary device arrays and dedicated read-out circuits has been developed and fully characterized. In particular, a capacitance to frequency converter has been integrated to measure the matching between different capacitors of a programmable array. Experimental results show that matching performance is comparable to previous technologies, making the 28nm technology eligible for analog signal processing in front-end circuits for physical experiments and related data converters. Samples have been sent to irradiation facility for high energy experiments compliance verification.

Elkhayat, M., Mangiarotti, S., De Berti, C., Grassi, M., Malcovati, P., Albano, D., et al. (2017). Device matching measurements in 28nm technology for high energy physics experiments. In 2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016 (pp.13-16). Institute of Electrical and Electronics Engineers Inc. [10.1109/ICECS.2016.7841120].

Device matching measurements in 28nm technology for high energy physics experiments

BASCHIROTTO, ANDREA
Ultimo
2017

Abstract

This work lies within SCALTECH28 project, whose main purpose is to investigate the performance of the 28nm technology in terms of signal processing quality, power consumption, and radiation hardness for applications in instrumentation electronics for particle physics with respect to previous technological generations. An additional target is to experimentally evaluate radiation damage effects on single devices and on full circuits to develop rad-models for simulations. A test chip including elementary device arrays and dedicated read-out circuits has been developed and fully characterized. In particular, a capacitance to frequency converter has been integrated to measure the matching between different capacitors of a programmable array. Experimental results show that matching performance is comparable to previous technologies, making the 28nm technology eligible for analog signal processing in front-end circuits for physical experiments and related data converters. Samples have been sent to irradiation facility for high energy experiments compliance verification.
No
paper
capacitive matching; capacitive-to-frequency converter; CMOS; high-energy physics experiments; oscillator; rad-hard; radiation damage; Ultra Scaled technology; Energy Engineering and Power Technology; Electrical and Electronic Engineering
English
23rd IEEE International Conference on Electronics, Circuits and Systems, ICECS - 11-14 december
9781509061136
Elkhayat, M., Mangiarotti, S., De Berti, C., Grassi, M., Malcovati, P., Albano, D., et al. (2017). Device matching measurements in 28nm technology for high energy physics experiments. In 2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016 (pp.13-16). Institute of Electrical and Electronics Engineers Inc. [10.1109/ICECS.2016.7841120].
Elkhayat, M; Mangiarotti, S; De Berti, C; Grassi, M; Malcovati, P; Albano, D; Baschirotto, A
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/153301
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