Room temperature VNA calibration to measure cryogenic devices can be inadequate when the loss of the unavoidable thermal decoupling line is order of magnitude higher than the DUT one. We present a cryogenic calibration set-up with an accuracy at the level of some tens of milli-dB for S21 parameter. © 2010 IEEE.
Zannoni, M., Bau', A., Gervasi, M., Passerini, A., Spinelli, S., Tartari, A., et al. (2010). Measurement accuracy of S-parameters in W band at cryogenic temperature. In IRMMW-THz 2010 - 35th International Conference on Infrared, Millimeter, and Terahertz Waves, Conference Guide (pp.1-2). IEEE [10.1109/ICIMW.2010.5612595].
Measurement accuracy of S-parameters in W band at cryogenic temperature
ZANNONI, MARIO
;BAU', ALESSANDROSecondo
;GERVASI, MASSIMO;PASSERINI, ANDREA;SPINELLI, SEBASTIANO MAURO;TARTARI, ANDREAPenultimo
;SIRONI, GIORGIOUltimo
2010
Abstract
Room temperature VNA calibration to measure cryogenic devices can be inadequate when the loss of the unavoidable thermal decoupling line is order of magnitude higher than the DUT one. We present a cryogenic calibration set-up with an accuracy at the level of some tens of milli-dB for S21 parameter. © 2010 IEEE.
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