Room temperature VNA calibration to measure cryogenic devices can be inadequate when the loss of the unavoidable thermal decoupling line is order of magnitude higher than the DUT one. We present a cryogenic calibration set-up with an accuracy at the level of some tens of milli-dB for S21 parameter. © 2010 IEEE.

Zannoni, M., Bau', A., Gervasi, M., Passerini, A., Spinelli, S., Tartari, A., et al. (2010). Measurement accuracy of S-parameters in W band at cryogenic temperature. In IRMMW-THz 2010 - 35th International Conference on Infrared, Millimeter, and Terahertz Waves, Conference Guide (pp.1-2). IEEE [10.1109/ICIMW.2010.5612595].

Measurement accuracy of S-parameters in W band at cryogenic temperature

ZANNONI, MARIO
;
BAU', ALESSANDRO
Secondo
;
GERVASI, MASSIMO;PASSERINI, ANDREA;SPINELLI, SEBASTIANO MAURO;TARTARI, ANDREA
Penultimo
;
SIRONI, GIORGIO
Ultimo
2010

Abstract

Room temperature VNA calibration to measure cryogenic devices can be inadequate when the loss of the unavoidable thermal decoupling line is order of magnitude higher than the DUT one. We present a cryogenic calibration set-up with an accuracy at the level of some tens of milli-dB for S21 parameter. © 2010 IEEE.
No
paper
Scientifica
Electrical and Electronic Engineering
English
35th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2010
9781424466573
Zannoni, M., Bau', A., Gervasi, M., Passerini, A., Spinelli, S., Tartari, A., et al. (2010). Measurement accuracy of S-parameters in W band at cryogenic temperature. In IRMMW-THz 2010 - 35th International Conference on Infrared, Millimeter, and Terahertz Waves, Conference Guide (pp.1-2). IEEE [10.1109/ICIMW.2010.5612595].
Zannoni, M; Bau', A; Gervasi, M; Passerini, A; Spinelli, S; Tartari, A; Sironi, G
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/152635
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