We report an experimental investigation by electron paramagnetic resonance (EPR) and Raman spectroscopy on a variety of amorphous silicon dioxide materials. Our study by EPR have permitted us to point out that the splitting of the primary hyperfine doublet of the Eγ′ center shows a relevant sample-to-sample variability, changing from ∼41.8 to ∼42.6 mT in the set of materials we considered. The parallel study by Raman spectroscopy has enabled us to state that this variability is attributable to the different Si-O-Si angle characterizing the matrices of the different materials. © 2009 Elsevier B.V. All rights reserved.

Buscarino, G., Vaccaro, G., Agnello, S., Gelardi, F. (2009). Variability of the Si-O-Si angle in amorphous-SiO2 probed by electron paramagnetic resonance and Raman spectroscopy. JOURNAL OF NON-CRYSTALLINE SOLIDS, 355(18-21), 1092-1094 [10.1016/j.jnoncrysol.2008.12.017].

Variability of the Si-O-Si angle in amorphous-SiO2 probed by electron paramagnetic resonance and Raman spectroscopy

VACCARO, GIANFRANCO
Secondo
;
2009

Abstract

We report an experimental investigation by electron paramagnetic resonance (EPR) and Raman spectroscopy on a variety of amorphous silicon dioxide materials. Our study by EPR have permitted us to point out that the splitting of the primary hyperfine doublet of the Eγ′ center shows a relevant sample-to-sample variability, changing from ∼41.8 to ∼42.6 mT in the set of materials we considered. The parallel study by Raman spectroscopy has enabled us to state that this variability is attributable to the different Si-O-Si angle characterizing the matrices of the different materials. © 2009 Elsevier B.V. All rights reserved.
Articolo in rivista - Articolo scientifico
Defects; Electron spin resonance; Magnetic properties; Microwave; Radiation; Radiation effects; Raman scattering; Raman spectroscopy; Silica; Condensed Matter Physics; Ceramics and Composites; Electronic, Optical and Magnetic Materials; Materials Chemistry2506 Metals and Alloys
English
2009
355
18-21
1092
1094
none
Buscarino, G., Vaccaro, G., Agnello, S., Gelardi, F. (2009). Variability of the Si-O-Si angle in amorphous-SiO2 probed by electron paramagnetic resonance and Raman spectroscopy. JOURNAL OF NON-CRYSTALLINE SOLIDS, 355(18-21), 1092-1094 [10.1016/j.jnoncrysol.2008.12.017].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/123871
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