We report an experimental investigation by electron paramagnetic resonance (EPR) and Raman spectroscopy on a variety of amorphous silicon dioxide materials. Our study by EPR have permitted us to point out that the splitting of the primary hyperfine doublet of the Eγ′ center shows a relevant sample-to-sample variability, changing from ∼41.8 to ∼42.6 mT in the set of materials we considered. The parallel study by Raman spectroscopy has enabled us to state that this variability is attributable to the different Si-O-Si angle characterizing the matrices of the different materials. © 2009 Elsevier B.V. All rights reserved.
Buscarino, G., Vaccaro, G., Agnello, S., & Gelardi, F. (2009). Variability of the Si-O-Si angle in amorphous-SiO2 probed by electron paramagnetic resonance and Raman spectroscopy. JOURNAL OF NON-CRYSTALLINE SOLIDS, 355(18-21), 1092-1094.
Citazione: | Buscarino, G., Vaccaro, G., Agnello, S., & Gelardi, F. (2009). Variability of the Si-O-Si angle in amorphous-SiO2 probed by electron paramagnetic resonance and Raman spectroscopy. JOURNAL OF NON-CRYSTALLINE SOLIDS, 355(18-21), 1092-1094. |
Tipo: | Articolo in rivista - Articolo scientifico |
Carattere della pubblicazione: | Scientifica |
Presenza di un coautore afferente ad Istituzioni straniere: | Si |
Titolo: | Variability of the Si-O-Si angle in amorphous-SiO2 probed by electron paramagnetic resonance and Raman spectroscopy |
Autori: | Buscarino, G; Vaccaro, G; Agnello, S; Gelardi, F |
Autori: | VACCARO, GIANFRANCO (Secondo) |
Data di pubblicazione: | 2009 |
Lingua: | English |
Rivista: | JOURNAL OF NON-CRYSTALLINE SOLIDS |
Digital Object Identifier (DOI): | http://dx.doi.org/10.1016/j.jnoncrysol.2008.12.017 |
Appare nelle tipologie: | 01 - Articolo su rivista |