State of the art instruments for astro-physis in the millimeter and submillimeter domain adopt cryogenic front-ends. Temperatures in the range 4-20 K are necessary to almost nullify the thermal noise from lossy passive components and operate low noise amplifiers in their proper regime. Extremely high accuracy in the control of systemat-ics is an unavoidable step towards the realization of ultra high sensitive instrumentation. For this reason a corresponding precision must be used in the characterization of the cryogenic front-end key components like feed horns, phase shifters, orthomode transducers and amplifiers. In this contribution we give a detailed description of the cryogenic set-up we have realized in our microwave lab to characterize at ultra low temperature (4K) by means of a VNA both active and passive devices.
Zannoni, M., Gervasi, M., Bau', A., Passerini, A. (2013). A cryogenic set-up for accurate characterization of microwave components for astrophysics. In Proceedings of the 2013 International Conference on Electromagnetics in Advanced Applications, ICEAA 2013 (pp.113-116). IEEE [10.1109/ICEAA.2013.6632200].
A cryogenic set-up for accurate characterization of microwave components for astrophysics
ZANNONI, MARIOPrimo
;GERVASI, MASSIMOSecondo
;BAU', ALESSANDRO;PASSERINI, ANDREA
2013
Abstract
State of the art instruments for astro-physis in the millimeter and submillimeter domain adopt cryogenic front-ends. Temperatures in the range 4-20 K are necessary to almost nullify the thermal noise from lossy passive components and operate low noise amplifiers in their proper regime. Extremely high accuracy in the control of systemat-ics is an unavoidable step towards the realization of ultra high sensitive instrumentation. For this reason a corresponding precision must be used in the characterization of the cryogenic front-end key components like feed horns, phase shifters, orthomode transducers and amplifiers. In this contribution we give a detailed description of the cryogenic set-up we have realized in our microwave lab to characterize at ultra low temperature (4K) by means of a VNA both active and passive devices.
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