A new crystal structure of quaterthiophene was identified by synchrotron X-ray diffraction at grazing incidence. Epitaxial growth of the oligothiophene, deposited by organic molecular beam deposition (OMBD), on a potassium acid phthalate (KAP) crystal substrate was demonstrated on the basis of the commensurability of the 4T crystal (ac diagonal) with the b-axis of the KAP crystal

Timpanaro, S., Sassella, A., Borghesi, A., Porzio, W., Fontaine, P., Goldmann, M. (2001). Crystal structure of epitaxial quaterthiophene thin films grown on potassium acid phthalate. ADVANCED MATERIALS, 13(2), 127-130 [10.1002/1521-4095(200101)13:2<127::AID-ADMA127>3.0.CO;2-Y].

Crystal structure of epitaxial quaterthiophene thin films grown on potassium acid phthalate

Sassella, A;Borghesi, A;
2001

Abstract

A new crystal structure of quaterthiophene was identified by synchrotron X-ray diffraction at grazing incidence. Epitaxial growth of the oligothiophene, deposited by organic molecular beam deposition (OMBD), on a potassium acid phthalate (KAP) crystal substrate was demonstrated on the basis of the commensurability of the 4T crystal (ac diagonal) with the b-axis of the KAP crystal
Articolo in rivista - Articolo scientifico
structural properties; thin molecular films
English
2001
13
2
127
130
none
Timpanaro, S., Sassella, A., Borghesi, A., Porzio, W., Fontaine, P., Goldmann, M. (2001). Crystal structure of epitaxial quaterthiophene thin films grown on potassium acid phthalate. ADVANCED MATERIALS, 13(2), 127-130 [10.1002/1521-4095(200101)13:2<127::AID-ADMA127>3.0.CO;2-Y].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/5136
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