We propose the use of Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) devices for the analysis of ablation results. Ablated samples have been obtained by irradiating an Al planar target with an optically smoothed iodine laser working at 0.44 mu m. The interpretation of FIB images shows the high potentiality of the technique.

Bussoli, M., Batani, D., Desai, T., Canova, F., Milani, M., Trtica, M., et al. (2007). Study of laser induced ablation with focused ion beam/scanning electron microscope devices. LASER AND PARTICLE BEAMS, 25(1), 121-125 [10.1017/S0263034607070139].

Study of laser induced ablation with focused ion beam/scanning electron microscope devices

BATANI, DINO DIMITRI;MILANI, MARZIALE;
2007

Abstract

We propose the use of Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) devices for the analysis of ablation results. Ablated samples have been obtained by irradiating an Al planar target with an optically smoothed iodine laser working at 0.44 mu m. The interpretation of FIB images shows the high potentiality of the technique.
Articolo in rivista - Articolo scientifico
electron emission relaxation region; ion flux; laser plasma generation; laser power; plasma heating; plasma interaction; target heating
English
mar-2007
25
1
121
125
none
Bussoli, M., Batani, D., Desai, T., Canova, F., Milani, M., Trtica, M., et al. (2007). Study of laser induced ablation with focused ion beam/scanning electron microscope devices. LASER AND PARTICLE BEAMS, 25(1), 121-125 [10.1017/S0263034607070139].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/4051
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