The focused ion beam (FIB) technique of nanomachining combined with simultaneous scanning electron microscopy (SEM) was used for submicron manipulation and imaging of unprepared (fresh) cells to demonstrate the potentiality of the FIB/SEM technique for ultramicroscopic studies. Sectioning at the nanoscale level was successfully performed by means of ion beam-driven milling operations that reveal the ultrastructure of fresh yeast cells. The FIB/SEM has many advantages over other ultramicroscopy techniques already applied for unprepared/fresh biological samples

Milani, M., Drobne, D. (2006). Focused ion beam manipulation and ultramicroscopy of unprepared cells. SCANNING, 28(3), 148-154 [10.1002/sca.4950280303].

Focused ion beam manipulation and ultramicroscopy of unprepared cells

MILANI, MARZIALE;
2006

Abstract

The focused ion beam (FIB) technique of nanomachining combined with simultaneous scanning electron microscopy (SEM) was used for submicron manipulation and imaging of unprepared (fresh) cells to demonstrate the potentiality of the FIB/SEM technique for ultramicroscopic studies. Sectioning at the nanoscale level was successfully performed by means of ion beam-driven milling operations that reveal the ultrastructure of fresh yeast cells. The FIB/SEM has many advantages over other ultramicroscopy techniques already applied for unprepared/fresh biological samples
Articolo in rivista - Articolo scientifico
focused ion beam; ultramicroscopy; electron microscopy; sample preparation; tomography; yeast cell
English
2006
28
3
148
154
none
Milani, M., Drobne, D. (2006). Focused ion beam manipulation and ultramicroscopy of unprepared cells. SCANNING, 28(3), 148-154 [10.1002/sca.4950280303].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/4047
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