The use of the Soft X-ray Contact Microscopy technique is discussed as a possible new tool to get information on dopant distribution in the core of single-mode optical fibers with 50 nm spatial resolution.

Milani, M., Batani, D., Ballerini, M., Pozzi, A., Savoia, C. (2004). Microscopy characterization of doped fibers. LASER AND PARTICLE BEAMS, 22(3), 351-354 [10.1017/S0263034604223205].

Microscopy characterization of doped fibers

MILANI, MARZIALE
;
BATANI, DINO DIMITRI;
2004

Abstract

The use of the Soft X-ray Contact Microscopy technique is discussed as a possible new tool to get information on dopant distribution in the core of single-mode optical fibers with 50 nm spatial resolution.
Articolo in rivista - Articolo scientifico
Dopant constration; Optical fibers; X-ray microscopy;
English
set-2004
22
3
351
354
none
Milani, M., Batani, D., Ballerini, M., Pozzi, A., Savoia, C. (2004). Microscopy characterization of doped fibers. LASER AND PARTICLE BEAMS, 22(3), 351-354 [10.1017/S0263034604223205].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/4045
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