We show that on suitably pit-patterned Si(001), deposition of just a few atomic layers of Ge can trigger a far larger flow of Si into the pits. This surprising effect results in anomalous smoothing of the substrate preceding island formation in the pits. We show that the effect naturally arises in continuum simulations of growth, and we identify its physical origin in the composition dependence of the surface diffusivity. Our interpretation suggests that anomalous smoothing is likely to also occur in other technologically relevant heteroepitaxial systems.

Bergamaschini, R., Tersoff, J., Tu, Y., Zhang, J., Bauer, G., Montalenti, F. (2012). Anomalous Smoothing Preceding Island Formation During Growth on Patterned Substrates. PHYSICAL REVIEW LETTERS, 109(15) [10.1103/PhysRevLett.109.156101].

Anomalous Smoothing Preceding Island Formation During Growth on Patterned Substrates

BERGAMASCHINI, ROBERTO;MONTALENTI, FRANCESCO CIMBRO MATTIA
2012

Abstract

We show that on suitably pit-patterned Si(001), deposition of just a few atomic layers of Ge can trigger a far larger flow of Si into the pits. This surprising effect results in anomalous smoothing of the substrate preceding island formation in the pits. We show that the effect naturally arises in continuum simulations of growth, and we identify its physical origin in the composition dependence of the surface diffusivity. Our interpretation suggests that anomalous smoothing is likely to also occur in other technologically relevant heteroepitaxial systems.
Articolo in rivista - Articolo scientifico
Heteroepitaxial growth; modeling; patterning; semiconductors
English
2012
109
15
156101
none
Bergamaschini, R., Tersoff, J., Tu, Y., Zhang, J., Bauer, G., Montalenti, F. (2012). Anomalous Smoothing Preceding Island Formation During Growth on Patterned Substrates. PHYSICAL REVIEW LETTERS, 109(15) [10.1103/PhysRevLett.109.156101].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/37462
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