Solution-processed and thermally annealed thin films from a series of n-alkyl terminated anilino squaraines are systematically investigated regarding their structural and optical properties by means of X-ray diffraction (XRD) and spectroscopic ellipsometry (SE). Their characteristic intense double-hump-shaped absorbance spectra consisting of coupled H-aggregate and intermolecular charge transfer (ICT) resonance bands make them appealing for fundamental light-matter interaction studies, and their environmental sustainability invites for consumer optoelectronic applications. Now, the single-crystal structure of the n-pentyl anilino squaraine (nPSQ) provides a missing link to identify potential odd-even effects with respect to the terminal alkyl chain for bulk crystals. While all single crystals adopt a triclinic unit cell with biaxial dielectric properties, the thin films condense into effectively uniaxial anisotropic thin films. Here, the inherently low sensitivity to the out-of-plane complex refractive index of SE in reflection is reasonably compensated by adding transmission SE and transmission intensity data. With that, a general picture of the structural and dielectric properties of n-alkyl anilino squaraine thin films is launched, revealing that the terminal alkyl chain length affects the structural and optical properties in a twofold way: we observe a steady change which is superimposed by an anisotropic odd-even effect.

Zablocki, J., Schulz, M., Schnakenburg, G., Beverina, L., Warzanowski, P., Revelli, A., et al. (2020). Structure and Dielectric Properties of Anisotropic n-Alkyl Anilino Squaraine Thin Films. JOURNAL OF PHYSICAL CHEMISTRY. C, 124(41), 22721-22732 [10.1021/acs.jpcc.0c07498].

Structure and Dielectric Properties of Anisotropic n-Alkyl Anilino Squaraine Thin Films

Beverina L.;
2020

Abstract

Solution-processed and thermally annealed thin films from a series of n-alkyl terminated anilino squaraines are systematically investigated regarding their structural and optical properties by means of X-ray diffraction (XRD) and spectroscopic ellipsometry (SE). Their characteristic intense double-hump-shaped absorbance spectra consisting of coupled H-aggregate and intermolecular charge transfer (ICT) resonance bands make them appealing for fundamental light-matter interaction studies, and their environmental sustainability invites for consumer optoelectronic applications. Now, the single-crystal structure of the n-pentyl anilino squaraine (nPSQ) provides a missing link to identify potential odd-even effects with respect to the terminal alkyl chain for bulk crystals. While all single crystals adopt a triclinic unit cell with biaxial dielectric properties, the thin films condense into effectively uniaxial anisotropic thin films. Here, the inherently low sensitivity to the out-of-plane complex refractive index of SE in reflection is reasonably compensated by adding transmission SE and transmission intensity data. With that, a general picture of the structural and dielectric properties of n-alkyl anilino squaraine thin films is launched, revealing that the terminal alkyl chain length affects the structural and optical properties in a twofold way: we observe a steady change which is superimposed by an anisotropic odd-even effect.
Articolo in rivista - Articolo scientifico
squaraine
English
5-ott-2020
2020
124
41
22721
22732
none
Zablocki, J., Schulz, M., Schnakenburg, G., Beverina, L., Warzanowski, P., Revelli, A., et al. (2020). Structure and Dielectric Properties of Anisotropic n-Alkyl Anilino Squaraine Thin Films. JOURNAL OF PHYSICAL CHEMISTRY. C, 124(41), 22721-22732 [10.1021/acs.jpcc.0c07498].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/294038
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