Binetti, S. (2017). Photoluminescence and infrared spectroscopy for impurities identification in silicon for pho-tovoltaic applications. Intervento presentato a: Workshop on: Crystalline Silicon for Low Cost Photovoltaics, Paris (France).

Photoluminescence and infrared spectroscopy for impurities identification in silicon for pho-tovoltaic applications

BINETTI, SIMONA OLGA
Primo
2017

slide
Defects , photoluminescence, silicon , infrared spectroscopy
English
Workshop on: Crystalline Silicon for Low Cost Photovoltaics
2017
2017
none
Binetti, S. (2017). Photoluminescence and infrared spectroscopy for impurities identification in silicon for pho-tovoltaic applications. Intervento presentato a: Workshop on: Crystalline Silicon for Low Cost Photovoltaics, Paris (France).
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/173925
Citazioni
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
Social impact