alpha,omega-dihexyl quaterthiophene thin films have been deposited by ultra-high vacuum sublimation on silica and potassium hydrogen phthalate substrates. The influence of the substrate on the structure of the films are investigated by transmission electron microscopy and the results are compared with the morphological and optical properties of the same samples

Campione, M., Borghesi, A., Moret, M., Sassella, A., Thierry, A. (2003). Structural characterisation of polycrystalline alpha,omega-dihexyl quaterthiophene thin films by transmission electron microscopy. Intervento presentato a: Spring Meeting of the European-Materials-Research-Society (EMRS) JUN 10-13, STRASBOURG, FRANCE.

Structural characterisation of polycrystalline alpha,omega-dihexyl quaterthiophene thin films by transmission electron microscopy

Campione, M;Sassella, A;
2003

Abstract

alpha,omega-dihexyl quaterthiophene thin films have been deposited by ultra-high vacuum sublimation on silica and potassium hydrogen phthalate substrates. The influence of the substrate on the structure of the films are investigated by transmission electron microscopy and the results are compared with the morphological and optical properties of the same samples
poster
organic molecular crystals, transmission electron microscopy
English
Spring Meeting of the European-Materials-Research-Society (EMRS) JUN 10-13
2003
2003
none
Campione, M., Borghesi, A., Moret, M., Sassella, A., Thierry, A. (2003). Structural characterisation of polycrystalline alpha,omega-dihexyl quaterthiophene thin films by transmission electron microscopy. Intervento presentato a: Spring Meeting of the European-Materials-Research-Society (EMRS) JUN 10-13, STRASBOURG, FRANCE.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/15663
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