In this work, the self-assembly of In3Sb1Te2 and In-doped Sb4Te1 nanowires (NWs) for phase change memories application was achieved by metal organic chemical vapor deposition, coupled with vapor-liquid-solid (VLS) mechanism, catalyzed by Au nanoparticles. Single crystal In3Sb1Te2 and In-doped Sb4Te1 NWs were obtained for different reactor pressures at 325 °C. The parameters influencing the NW self-assembly were studied and the compositional, morphological, and structural analysis of the grown structures was performed, also comparing the effect of the used substrate (crystalline Si and SiO2). In both cases, NWs of several micrometer in length and with diameters as small as 15 nm were obtained.

Selmo, S., Cecchi, S., Cecchini, R., Wiemer, C., Fanciulli, M., Rotunno, E., et al. (2016). MOCVD growth and structural characterization of In-Sb-Te nanowires. PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE, 213(2), 335-338 [10.1002/pssa.201532381].

MOCVD growth and structural characterization of In-Sb-Te nanowires

SELMO, SIMONE
Primo
;
Cecchi, S;FANCIULLI, MARCO;
2016

Abstract

In this work, the self-assembly of In3Sb1Te2 and In-doped Sb4Te1 nanowires (NWs) for phase change memories application was achieved by metal organic chemical vapor deposition, coupled with vapor-liquid-solid (VLS) mechanism, catalyzed by Au nanoparticles. Single crystal In3Sb1Te2 and In-doped Sb4Te1 NWs were obtained for different reactor pressures at 325 °C. The parameters influencing the NW self-assembly were studied and the compositional, morphological, and structural analysis of the grown structures was performed, also comparing the effect of the used substrate (crystalline Si and SiO2). In both cases, NWs of several micrometer in length and with diameters as small as 15 nm were obtained.
Articolo in rivista - Articolo scientifico
In-Sb-Te nanowires; MOCVD; phase-change memory; VLS;
In-Sb-Te nanowires; MOCVD; phase-change memory; VLS; Electrical and Electronic Engineering; Electronic, Optical and Magnetic Materials;
English
feb-2016
2016
213
2
335
338
none
Selmo, S., Cecchi, S., Cecchini, R., Wiemer, C., Fanciulli, M., Rotunno, E., et al. (2016). MOCVD growth and structural characterization of In-Sb-Te nanowires. PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE, 213(2), 335-338 [10.1002/pssa.201532381].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/130203
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